Probe table tester, used for chip, gas sensitive components and other electrical properties in different atmospheres, can also be used for material analysis.
Wide measurement temperature, high temperature control precision.
XYZ triaxial movement, high positioning accuracy.
Excellent vacuum leakage rate, high vacuum degree.
Small and precise, easy to handle.
Probe table tester, used for chip, gas sensitive components and other electrical properties in different atmospheres, can also be used for material analysis. Widely used in semiconductor electrical performance testing, physical research, gas sensitive analysis, integrated circuit, LED, LCD, solar cells and other industries manufacturing and research collar and other important components in the system.